Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method.
Ya-Chi ChengPai-Yu TanCheng-Wen WuMing-Der ShiehChien-Hui ChuangGordon LiaoPublished in: ITC (2022)
Keyphrases
- pairwise
- high accuracy
- computational complexity
- high quality
- fully automatic
- similarity measure
- neural network
- high precision
- data sets
- test data
- probabilistic model
- edge detection
- quality measures
- classification method
- optimization algorithm
- high speed
- memory usage
- denoising
- classification accuracy
- computational cost
- dynamic programming
- cost function
- significant improvement
- prior knowledge
- data structure
- objective function
- multiscale