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Two Deep Learning Networks for Rail Surface Defect Inspection of Limited Samples With Line-Level Label.
Defu Zhang
Kechen Song
Qi Wang
Yu He
Xin Wen
Yunhui Yan
Published in:
IEEE Trans. Ind. Informatics (2021)
Keyphrases
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deep learning
defect detection
unsupervised learning
unsupervised feature learning
machine learning
weakly supervised
deep architectures
automated visual inspection
data sets
graph cuts
image segmentation
pairwise
viewpoint
probabilistic model
question answering
mental models