Login / Signup

P^(2)CLRAF: An Pre- and Post-Silicon Cooperated Circuit Lifetime Reliability Analysis Framework.

Song JinYinhe HanHuawei LiXiaowei Li
Published in: Asian Test Symposium (2010)
Keyphrases
  • reliability analysis
  • high speed
  • low cost
  • expert systems
  • energy consumption
  • high density