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Towards Blackbox Identity Testing of Log-Variate Circuits.

Michael A. ForbesSumanta GhoshNitin Saxena
Published in: ICALP (2018)
Keyphrases
  • high speed
  • test set
  • test data
  • databases
  • identity management
  • real time
  • information systems
  • database systems
  • training data
  • fault model