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A Fully Integrated Built-In Self-Test Sigma-Delta ADC Based on the Modified Controlled Sine-Wave Fitting Procedure.

Hao-Chiao HongFang-Yi SuShao-Feng Hung
Published in: IEEE Trans. Instrum. Meas. (2010)
Keyphrases
  • fully integrated
  • sigma delta
  • high order
  • image sensor
  • matlab simulink
  • workflow management
  • built in self test
  • genetic algorithm
  • control system
  • image restoration
  • data management
  • mathematical model
  • machine vision