VLSI testing based security metric for IC camouflaging.
Jeyavijayan RajendranOzgur SinanogluRamesh KarriPublished in: ITC (2013)
Keyphrases
- fault injection
- security policies
- integrated circuit
- high speed
- signal processing
- security systems
- security problems
- information security
- information assurance
- intrusion detection
- distance function
- network security
- access control
- data mining
- computer security
- penetration testing
- security level
- key management
- software testing
- statistical databases
- metric space
- distance measure
- functional requirements
- security requirements
- security protocols
- security model
- security management
- privacy preserving
- test cases