• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Full-Chip Model for Leakage-Current Estimation Considering Within-Die Correlation.

Khaled R. HeloueNavid AziziFarid N. Najm
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
  • computational model
  • parameter estimation
  • mathematical model
  • probabilistic model
  • probability distribution
  • low cost
  • markov random field
  • signal processing
  • estimation process