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A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead.
Jun Furuta
Shotaro Sugitani
Ryuichi Nakajima
Kazutoshi Kobayashi
Published in:
IRPS (2024)
Keyphrases
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neural network
machine learning
high speed
database
control system
event detection