Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm.
Seoyeon ChoiDong Geun ParkMin Jung KimSeain BangJungchun KimSeunghee JinKi Seok HuhDonghyun KimJérôme MitardCheol E. HanJae Woo LeePublished in: Adv. Intell. Syst. (2023)