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Electric potential and threshold voltage models for double-gate Schottky-barrier source/drain MOSFETs.
Peicheng Li
Guangxi Hu
Ran Liu
Tingao Tang
Published in:
Microelectron. J. (2011)
Keyphrases
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schottky barrier
experimental data
field effect transistors
prior knowledge
complex systems
power supply
data sets
wireless sensor networks
probabilistic model
high speed
statistical model
steady state