Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied Tests.

Hari Addepalli Irith Pomeranz

Published in: ACM Great Lakes Symposium on VLSI (2022)

Keyphrases

computational complexity
orders of magnitude
machine learning
learning algorithm
computational cost
recently developed
database
neural network
image segmentation
significant improvement
worst case
theoretical analysis
machine learning algorithms
test data
times faster