Test-Pattern Ordering for Wafer-Level Test-During-Burn-In.

Sudarshan Bahukudumbi Krishnendu Chakrabarty

Published in: VTS (2008)

Keyphrases

database
data sets
wide range
databases
information retrieval
genetic algorithm
social networks
feature selection
e learning
database systems
feature extraction
low level
test cases
pattern matching
pattern discovery