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Test-Pattern Ordering for Wafer-Level Test-During-Burn-In.
Sudarshan Bahukudumbi
Krishnendu Chakrabarty
Published in:
VTS (2008)
Keyphrases
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database
data sets
wide range
databases
information retrieval
genetic algorithm
social networks
feature selection
e learning
database systems
feature extraction
low level
test cases
pattern matching
pattern discovery