Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement.

Yinan N. Shen Fabrizio Lombardi

Published in: ITC (1989)

Keyphrases

multiple faults
discrete event
image processing
case study
image segmentation
database systems
fault diagnosis
database
real world
information systems
metadata
cooperative
special case
state space
eliminate redundant