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On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.

Piet EngelkeIlia PolianMichel RenovellSandip KunduBharath SeshadriBernd Becker
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
  • low voltage
  • power line
  • object detection
  • design considerations
  • pattern recognition
  • power consumption
  • multimedia
  • power management