Multi-variable double resonant controller for fast image scanning of atomic force microscope.
Sajal K. DasHemanshu Roy PotaIan R. PetersenPublished in: ASCC (2013)
Keyphrases
- image data
- multiscale
- image retrieval
- input image
- image content
- image segmentation
- image pixels
- image analysis
- single image
- image classification
- high resolution
- image features
- image representation
- template matching
- vector field
- neural network
- laser scanning
- image quality
- low level
- real time
- image matching
- region of interest
- pixel values
- computer vision
- visual inspection
- ccd camera
- robotic manipulator
- microscope images
- raster scan