A scalable high-frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design.
Sorin P. VoinigescuMichael C. MaliepaardJonathan L. ShowellGreg E. BabcockDavid MarchesanMichael SchroterPeter SchvanDavid L. HaramePublished in: IEEE J. Solid State Circuits (1997)
Keyphrases
- noise model
- high frequency
- low frequency
- noise level
- noisy images
- wavelet transform
- gaussian noise
- high resolution
- high frequencies
- gaussian distribution
- wavelet coefficients
- high frequency components
- subband
- visual quality
- low pass
- discrete wavelet transform
- integrated circuit
- denoising algorithm
- low power
- high speed
- blocking artifacts
- high density
- multiresolution
- random noise
- signal to noise ratio
- wavelet domain