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Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation.
JaeHyun Seo
Sangheon Lee
Kwangmin Kim
Sooeun Lee
Hyunsang Hwang
Byungsub Kim
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
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empirical data
high speed
fully automatic
real time
data driven
semi automatic
circuit design
genetic algorithm
three dimensional
trust model