Login / Signup

Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation.

JaeHyun SeoSangheon LeeKwangmin KimSooeun LeeHyunsang HwangByungsub Kim
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
  • empirical data
  • high speed
  • fully automatic
  • real time
  • data driven
  • semi automatic
  • circuit design
  • genetic algorithm
  • three dimensional
  • trust model