Clustering Enhancement of Noisy Cryo-Electron Microscopy Single-Particle Images with a Network Structural Similarity Metric.
Shuo YinBiao ZhangYang YangYan HuangHong-Bin ShenPublished in: J. Chem. Inf. Model. (2019)
Keyphrases
- electron microscopy
- similarity metric
- x ray
- low energy
- image stacks
- clustering framework
- microscopy images
- similarity measure
- thin film
- similarity metrics
- transmission electron microscopy
- pairwise similarities
- clustering algorithm
- euclidean metric
- k means
- image retrieval
- clustering method
- content similarity
- network structure
- three dimensional
- image processing
- deformable registration
- spectral clustering
- image enhancement
- input image
- ground truth