Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy.

Kristian Granhaug Snorre Aunet

Published in: J. Electron. Test. (2008)

Keyphrases

low voltage
focal plane
wireless networks
high speed
input data
power consumption
low cost
infrared
circuit design
genetic algorithm
image sequences
feature extraction
information content
defect detection
floating gate