Defect Classification of Electronic Circuit Board Using SVM based on Random Sampling.
Hiroaki HagiYuji IwahoriShinji FukuiYoshinori AdachiManas Kamal BhuyanPublished in: KES (2014)
Keyphrases
- random sampling
- defect classification
- active learning
- circuit board
- sampling algorithm
- sample size
- random projections
- sampling methods
- sampling procedure
- support vector
- sliding window
- support vector machine
- stratified sampling
- random samples
- viewpoint
- markov random field
- high dimensional
- random sample
- machine learning