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Phase difference analysis technique for parametric faults BIST in CMOS analog circuits.

Chatchai WannaboonNattagit JiteurtragoolWimol San-UmMasayoshi Tachibana
Published in: IEICE Electron. Express (2018)
Keyphrases
  • analog circuits
  • phase difference
  • neural network
  • pattern recognition
  • low cost
  • fault diagnosis
  • low power