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Phase difference analysis technique for parametric faults BIST in CMOS analog circuits.
Chatchai Wannaboon
Nattagit Jiteurtragool
Wimol San-Um
Masayoshi Tachibana
Published in:
IEICE Electron. Express (2018)
Keyphrases
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analog circuits
phase difference
neural network
pattern recognition
low cost
fault diagnosis
low power