Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning.
Wenxia BaoJian ZhaoGensheng HuDongyan ZhangLinsheng HuangDong LiangPublished in: Sustain. Comput. Informatics Syst. (2021)
Keyphrases
- metric learning
- maximum margin criterion
- multiple kernel
- distance metric learning
- distance metric
- dimensionality reduction
- subspace learning
- semi supervised
- multiple features
- pairwise
- nearest neighbor classification
- multi task
- learning tasks
- distance function
- feature space
- image classification
- kernel matrix
- principal component analysis
- manifold learning
- kernel learning
- data sets
- active learning
- image annotation
- semi supervised learning
- low dimensional
- reinforcement learning
- feature selection