Pre-silicon Noise to Timing Test Methodology.

Fern Nee Tan Jia Yun Chuah

Published in: ATS (2020)

Keyphrases

missing data
low cost
post test
neural network
image processing
video sequences
noisy environments
noise model
noisy data
noise level
high density
random noise
design methodology
test cases
high speed
training data
data mining