A figure of merit for the high-frequency noise behavior of bipolar transistors.
Leo C. N. de VreedeHenk C. de GraaffG. A. M. HurkxJoseph L. TauritzRoel G. F. BaetsPublished in: IEEE J. Solid State Circuits (1994)
Keyphrases
- high frequency
- figure of merit
- low frequency
- high resolution
- wavelet transform
- edge detector
- high frequencies
- visual quality
- wavelet coefficients
- subband
- wavelet shrinkage
- low pass
- frequency domain
- high frequency components
- wavelet domain
- discrete wavelet transform
- multiscale
- wavelet decomposition
- edge detection
- noise level
- noise model
- multiresolution
- co occurrence
- image processing
- image analysis