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Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices.
Pooya Jannaty
Florian C. Sabou
R. Iris Bahar
Joseph L. Mundy
William R. Patterson
Alexander Zaslavsky
Published in:
ACM Great Lakes Symposium on VLSI (2010)
Keyphrases
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optimal solution
low cost
floating gate
infrared
linear equations
high speed
power consumption
noise level
noise model
imaging devices
measurement noise
signal to noise ratio
random noise
measurement errors