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Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers.
Tomi Laurila
J. Hurtig
Vesa Vuorinen
Jorma K. Kivilahti
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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electron microscopy
low energy
finite element
wire bonding
x ray
experimental data
multi layer
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