A programmable built-in self-test for embedded DRAMs.

Shibaji Banerjee Dipanwita Roy Chowdhury Bhargab B. Bhattacharya

Published in: MTDT (2005)

Keyphrases

built in self test
low cost
embedded systems
pattern recognition
data mining
information retrieval
multimedia
multiresolution
general purpose
data sets
computer vision
metadata
image processing
computational complexity
medical images
integrated circuit