On-chip ramp generators for mixed-signal BIST and ADC self-test.

Benoit Provost Edgar Sánchez-Sinencio

Published in: IEEE J. Solid State Circuits (2003)

Keyphrases

mixed signal
built in self test
low power
analog to digital converter
vlsi circuits
multi channel
single chip
digital circuits
low cost
high speed
integrated circuit
cmos technology
power consumption
data generator
circuit design