An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories.

Jin-Fu Li Tsu-Wei Tseng Chin-Long Wey

Published in: DATE (2005)

Keyphrases

detection scheme
data sets
multiscale
co occurrence
low cost
test cases
embedded systems
classification scheme
robust watermarking scheme
content addressable
recognition scheme
linguistic information
bi directional
representation scheme
similarity measure
search engine
information retrieval