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System-on-Chip Testability Using LSSD Scan Structures.

Kamran ZarrinehShambhu J. UpadhyayaVivek Chickermane
Published in: IEEE Des. Test Comput. (2001)
Keyphrases
  • power consumption
  • hardware and software
  • databases
  • information retrieval
  • information systems
  • machine learning
  • artificial neural networks
  • tree structures