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An example of fault site localization on a 0.18 mum CMOS device with combination of front and backside techniques.
Yoshiteru Yamada
Hirotaka Komoda
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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fault diagnosis
low cost
real time
power consumption
object localization
circuit design
multiple faults
neural network
computer vision
high speed
low power
power supply
localization algorithm
metal oxide semiconductor