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Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors.

Janusz RajskiMiodrag PotkonjakAdit D. SinghAbhijit ChatterjeeZain NavabiMatthew R. GuthausSezer Gören
Published in: VLSI-SoC (2013)
Keyphrases
  • neural network
  • embedded systems
  • real time
  • real world
  • data mining
  • machine learning
  • low cost
  • signal processing
  • integrated circuit
  • smart camera