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On Testing of Josephson Logic Circuits Consisting of RSFQ Dual-Rail Logic Gates.
Teruhiko Yamada
Tsuneto Hanashima
Yasuhiro Suemori
Masaaki Maezawa
Published in:
Asian Test Symposium (1998)
Keyphrases
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logic circuits
low power
high speed
delay insensitive
low cost
asynchronous circuits
power consumption
logic synthesis
functional decomposition
gate array
tunnel diode
digital signal processing
image analysis
wireless networks
pattern recognition
computer vision
real time