Login / Signup

Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study.

Pierre-Emmanuel GaillardonHassan GhasemzadehGiovanni De Micheli
Published in: LATW (2013)
Keyphrases
  • empirical studies
  • high density
  • high speed
  • data sets
  • search engine
  • information systems
  • image processing
  • case study