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Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.

Joel GrodsteinDilip K. BhavsarVijay BettadaRichard A. Davies
Published in: ICCD (2003)
Keyphrases
  • critical path
  • job shop scheduling problem
  • automatically generate
  • design methodology
  • artificial intelligence
  • high speed
  • special purpose hardware
  • neural network
  • instruction set