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Reliability Characterization of Logic-Compatible NAND Flash Memory based Synapses with 3-bit per Cell Weights and 1μA Current Steps.

Minsu KimJeehwan SongChris H. Kim
Published in: IRPS (2020)
Keyphrases
  • weighted sum
  • neural network
  • logical operations
  • data storage
  • network model
  • relative importance
  • reliability analysis
  • random access memory