Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors.

Manish Gupta Abhinav Kranti

Published in: VLSI Design (2019)

Keyphrases

physical phenomena
global optimization
combinatorial optimization
distance metric
mathematical models
machine learning
optimization problems
multi objective
distance measure
computational model
optimization method
digital images
cooperative
metric learning
constrained optimization
image formation
high quality