On-chip analog signal generation for mixed-signal built-in self-test.
Benoit DufortGordon W. RobertsPublished in: IEEE J. Solid State Circuits (1999)
Keyphrases
- mixed signal
- low power
- multi channel
- vlsi circuits
- digital circuits
- built in self test
- power consumption
- high speed
- low cost
- cmos technology
- signal processing
- low voltage
- image sensor
- genetic algorithm
- low power consumption
- high resolution
- analog to digital converter
- real time
- multi view
- integrated circuit
- image processing