A compressed sensing measurement matrix for atomic force microscopy.
Brian D. MaxwellSean B. AnderssonPublished in: ACC (2014)
Keyphrases
- measurement matrix
- compressed sensing
- atomic force microscopy
- random projections
- dimensionality reduction
- image reconstruction
- dimension reduction
- original data
- sparse representation
- random sampling
- low dimensional
- singular value decomposition
- principal component analysis
- structure from motion
- high dimensionality
- missing data
- object recognition
- hash functions
- high dimensional data
- signal processing
- factorization method
- least squares
- input image