Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors.
Hangyang LiTongguang YangXinglin LiuJingyi ZhongJiaxin MoHan ZhouZhongkun XiaoPublished in: IEEE Access (2023)
Keyphrases
- field effect transistors
- high density
- steady state
- mathematical analysis
- optimization algorithm
- global optimization
- gate dielectrics
- optimization problems
- optimization methods
- optimization process
- high power
- database
- artificial neural networks
- database systems
- constrained optimization
- information retrieval
- neural network
- highly reliable
- data sets