Improved Read Access in GC-eDRAM Memory by Dual-Negative Word-Line Technique.

Roman Golman Robert Giterman Odem Harel Adam Teman

Published in: ISCAS (2020)

Keyphrases

read write
random access
hard disk
co occurrence
positive and negative
line segments
main memory
secondary storage
memory usage
improved algorithm
memory access
word sense disambiguation
memory requirements
disk storage
write operations
keywords
computing power
n gram
windows xp