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A generalised uncertain decision tree for defect classification of multiple wafer maps.
Byunghoon Kim
Youngseon Jeong
Seung Hoon Tong
Myong K. Jeong
Published in:
Int. J. Prod. Res. (2020)
Keyphrases
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decision trees
defect classification
databases
logistic regression
predictive accuracy
information gain
real time
real world
machine learning
genetic algorithm
decision making
training data
classification accuracy
naive bayes