Byunghoon Kim

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 13

Top Topics

Similarity Measure

Outlier Detection

Top Venues

Expert Syst. Appl.

Ann. Oper. Res.

IEEE Trans. Engineering Management

Publications

Juho Yoon, Aparajita Bose, Hun Park, Jongtaik Lee, Byunghoon Kim
A Novel Methodology for Estimating Technology Value and Importance of Factors in Market-Based Approach. Syst. 11 (9) (2023)
Jeongsub Choi, Ali Tosyali, Byunghoon Kim, Ho-Shin Lee, Myong Kee Jeong
A Novel Method for Identifying Competitors Using a Financial Transaction Network. IEEE Trans. Engineering Management 69 (4) (2022)
Iqbal Muhammad Zubair, Byunghoon Kim
A Group Feature Ranking and Selection Method Based on Dimension Reduction Technique in High-Dimensional Data. IEEE Access 10 (2022)
Myoungjae Choi, Sun-Hi Yoo, Jongtaik Lee, Jeongsub Choi, Byunghoon Kim
A modified gamma/Gompertz/NBD model for estimating technology lifetime. Scientometrics 127 (10) (2022)
Byunghoon Kim, Young-Seon Jeong, Myong K. Jeong
New multivariate kernel density estimator for uncertain data classification. Ann. Oper. Res. 303 (1) (2021)
Jeongsub Choi, Byunghoon Kim, Chang Hee Han, Hyuk Hahn, Hun Park, Jaeyoung Yoo, Myong Kee Jeong
Methodology for assessing the contribution of knowledge services during the new product development process to business performance. Expert Syst. Appl. 167 (2021)
Ali Tosyali, Jeongsub Choi, Byunghoon Kim, Ho-Shin Lee, Myong K. Jeong
A dynamic graph-based approach to ranking firms for identifying key players using inter-firm transactions. Ann. Oper. Res. 303 (1) (2021)
Taejong Joo, Donggu Kang, Byunghoon Kim
Regularizing activations in neural networks via distribution matching with the Wasserstein metric. CoRR (2020)
Byunghoon Kim, Youngseon Jeong, Seung Hoon Tong, Myong K. Jeong
A generalised uncertain decision tree for defect classification of multiple wafer maps. Int. J. Prod. Res. 58 (9) (2020)
Taejong Joo, Donggu Kang, Byunghoon Kim
Regularizing activations in neural networks via distribution matching with the Wasserstein metric. ICLR (2020)
Jeongsub Choi, Byunghoon Kim, Hyuk Hahn, Hun Park, Yongil Jeong, Jaeyoung Yoo, Myong Kee Jeong
Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms. Expert Syst. Appl. 84 (2017)
Byunghoon Kim, Gianluca Gazzola, Jaekyung Yang, Jae-Min Lee, Byoung-Youl Coh, Myong K. Jeong, Youngseon Jeong
Two-phase edge outlier detection method for technology opportunity discovery. Scientometrics 113 (1) (2017)
Andrew Rodriguez, Ali Tosyali, Byunghoon Kim, Jeongsub Choi, Jae-Min Lee, Byoung-Youl Coh, Myong K. Jeong
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery. IEEE Trans. Engineering Management 63 (4) (2016)
Kang Zhao, Yao Xie, Kwok-Leung Tsui, Qingming Wei, Wenpo Huang, Wei Jiang, Yanting Li, Su Gon Cho, Seoung Bum Kim, Kaibo Liu, Jianjun Shi, Youngseon Jeong, Byunghoon Kim, Seung Hoon Tong, In-Kap Chang, Myong Kee Jeong, Florent Charruaud, Lishuai Li
System Informatics: From Methodology to Applications. IEEE Intell. Syst. 30 (6) (2015)
Andrew Rodriguez, Byunghoon Kim, Mehmet Turkoz, Jae-Min Lee, Byoung-Youl Coh, Myong Kee Jeong
New multi-stage similarity measure for calculation of pairwise patent similarity in a patent citation network. Scientometrics 103 (2) (2015)
Andrew Rodriguez, Byunghoon Kim, Jae-Min Lee, Byoung-Yul Coh, Myong K. Jeong
Graph kernel based measure for evaluating the influence of patents in a patent citation network. Expert Syst. Appl. 42 (3) (2015)
Sun-Hi Yoo, Byunghoon Kim, Myong Kee Jeong
Modelling of technology lifetime based on patent citation data and segmentation. J. Oper. Res. Soc. 66 (3) (2015)
Byunghoon Kim, Gianluca Gazzola, Jae-Min Lee, Dohyun Kim, Kanghoe Kim, Myong K. Jeong
Inter-cluster connectivity analysis for technology opportunity discovery. Scientometrics 98 (3) (2014)
Bongsub Song, Nayeon Cho, Byunghoon Kim, Jung-Han Choi, Young-Lok Kim, Jinwook Burm
An Autofocus Sensor With Global Shutter Using Offset-Free Frame Memory. IEEE Trans. Circuits Syst. II Express Briefs (11) (2010)