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Use of a Secondary Current Sensor in Plasma during Electron-Beam Welding with Focus Scanning for Process Control.
Dmitriy Trushnikov
Elena Krotova
Elena Koleva
Published in:
J. Sensors (2016)
Keyphrases
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process control
electron beam
control system
intelligent control
product quality
manufacturing process
sensor data
semiconductor manufacturing
sensor networks
wireless sensor networks
evolutionary algorithm
neural network
x ray
computer aided
user interface
decision making
remote control