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Charge accumulation and their relaxation in SiO2 films containing silicon nanocrystals.

Gang LiHaisheng SanXuyuan Chen
Published in: NEMS (2010)
Keyphrases
  • space charge
  • silicon dioxide
  • electric field
  • probabilistic relaxation
  • silicon nitride
  • iterative algorithms
  • lognormal distribution
  • data sets
  • objective function
  • leakage current