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Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration.

Keith A. BowmanSteven G. DuvallJames D. Meindl
Published in: IEEE J. Solid State Circuits (2002)
Keyphrases
  • frequency distribution
  • databases
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  • data mining
  • relational databases
  • data model
  • high speed