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Reliability Characterization of a Flexible Interconnect for Cryogenic and Quantum Applications.

Emma R. SchmidgallFlavio GriggioGeorge H. ThielSherman E. PeekBhargav YelamanchiliArchit ShahVaibhav GuptaJohn A. SellersMichael C. HamiltonDavid B. TuckermanSamuel d'Hollosy
Published in: IRPS (2021)
Keyphrases
  • high speed
  • real world
  • information systems
  • lightweight
  • reliability analysis
  • quantum evolutionary algorithm
  • neural network
  • evolutionary algorithm
  • highly reliable
  • quantum mechanics
  • axiomatic characterization