Testability Prediction for Sequential Circuits Using Neural Network.
Shiyi XuPeter WaignjoPercy G. DiasBole ShiPublished in: Asian Test Symposium (1997)
Keyphrases
- neural network
- prediction model
- analog circuits
- multi layer perceptron
- prediction accuracy
- prediction algorithm
- pattern recognition
- genetic algorithm
- artificial neural networks
- neural network model
- bp neural network
- elman network
- mining sequential
- feed forward
- back propagation
- hidden layer
- neural network ensemble
- feed forward neural networks
- high speed
- tunnel diode
- auto associative
- fuzzy logic
- fault diagnosis
- prediction error
- recurrent neural networks
- self organizing maps