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A unified approach to simulating electrical and thermal substrate coupling interactions in ICs.

Nishath K. VergheseSang-Soo LeeDavid J. Allstot
Published in: ICCAD (1993)
Keyphrases
  • electrical properties
  • infrared
  • film thickness
  • database
  • real time
  • printed circuit boards
  • power grid
  • thermal images
  • electro mechanical