Electronically programmable test points for on-chip analog/digital measurements.
Murillo FrancoJairo GüizaErasmo ChiappettaSergio RuedaH. LuisJ. BertuzzoJim KoeppeTim RobinsJulian JenkinsTara Julia HamiltonPublished in: ISCAS (2013)
Keyphrases
- mixed signal
- circuit design
- cmos image sensor
- single chip
- low power
- low cost
- multi channel
- analog vlsi
- high speed
- digital signal processors
- point sets
- endpoints
- signal processor
- processor array
- programmable logic
- delta sigma
- sigma delta
- cmos technology
- digital circuits
- data points
- solid state
- dynamic range
- test data
- analog to digital converter
- sample points
- real time
- image sensor
- power consumption
- optical flow
- digital libraries